发明名称 |
METHOD TO FORM A METALLIC LAYER ON THE LONG WALL OF THE SEMI-CONDUCTOR DEVICES HIGH |
摘要 |
PURPOSE: An improvement of a semi-conductor about its character and confidence gets accomplished by the metallic layer of a long wall having the high density and having the stability through plasma heat treatment. CONSTITUTION: A method to form a metallic layer on the long wall of the semiconductor devices is provided by the followings; a procedure to form a contact hole (120) to a chosen area of the insulation film (110) between the layers, after forming an insulation film (110) between the layers onto a semi-conductor substrate to be formed a conductive pattern; a procedure to form the metallic layer on the long wall of the film of titanium/titanium nitride onto whole structure containing the above contact hole (120); a procedure to apply a plasma heat treatment on a semi-conductor substrate to be formed the metallic layers (130) of a long wall for stabilizing the metallic layer of a long wall; a procedure to form the metal line distribution electrically connecting the semi-conductor substrate through the above contact hole (120).
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申请公布号 |
KR20000027927(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045972 |
申请日期 |
1998.10.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
YI, JEONG RAE;GWON, HYEOK GIN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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