发明名称 METHOD OF MANUFACTURING CAPACITOR OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE: A capacitor of semiconductor element is provided to prevent the contact defect of the source area and the capacitor due to bird's beak by not forming the field oxide process. CONSTITUTION: A system comprises a semiconductor substrate(21), a gate line(22), a gate oxide layer(23), an active area(24), a source area(24a), a drain area(24b), a first sensitive layer, an interlayer dielectrics(26), a second sensitive layer, a storage electrode(28), a conductive layer(29), and a plate electrode. The gate insulation layer is formed on the gate line. The active area is formed to cross the gate line. The source area and the drain area are formed on the surface of the active area. The conductive layer is formed on the storage electrode. The interlayer dielectrics has the contact hole and is formed on the source area.
申请公布号 KR20000027883(A) 申请公布日期 2000.05.15
申请号 KR19980045927 申请日期 1998.10.29
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 JEONG, SUNG BAE
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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