发明名称 |
METHOD FOR FORMING PLUG OF SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A plug formation method is provided to prevent a damage of a poly gate and a spacer by using two-step plug formation processes using double insulators having double contact holes. CONSTITUTION: A first insulating layer(30) is deposited on a poly gate(20) and a spacer(25). A first contact hole is formed by etching the first insulating layer(30). A first plug(50) is formed by filling into the first contact hole(40). After depositing a second insulating layer(60) on the resultant structure, a second contact hole connected to the first plug(50) is formed. Then, a second plug(85) is formed by filling to the second contact hole.
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申请公布号 |
KR20000027809(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045838 |
申请日期 |
1998.10.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
PARK, CHUL JOON |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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