发明名称 |
METHOD FOR FORMING CONTACT HOLE IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a contact hole is to prevent an undoped oxide film, which is exposed when etching a doped oxide film, from being etched. CONSTITUTION: After a field oxide film(101) is formed on a silicon substrate(100), an insulating oxide film(1) is deposited on the field oxide film, and a bit line or capacitor(3) is formed on the insulating oxide film. After an undoped oxide film(2) of a thin thickness is deposited on the bit line or capacitor, a doped oxide film of a thick thickness is deposited on the undoped oxide film. A photoresist mask pattern(5) is formed on the doped oxide film, and the doped oxide film is isotropic-etched using an HF vapor of a low pressure. The residue doped oxide film and the undoped oxide film are etched to form a contact hole(10) exposing the substrate and the bit line or capacitor. When the doped oxide film is etched, a partial pressure is controlled to be below 500 Pascal.
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申请公布号 |
KR100256801(B1) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19930011065 |
申请日期 |
1993.06.17 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD. |
发明人 |
KIM, MYUNG SEON;LEE, SEOK HEE |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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