发明名称 METHOD FOR FORMING CONTACT HOLE IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a contact hole is to prevent an undoped oxide film, which is exposed when etching a doped oxide film, from being etched. CONSTITUTION: After a field oxide film(101) is formed on a silicon substrate(100), an insulating oxide film(1) is deposited on the field oxide film, and a bit line or capacitor(3) is formed on the insulating oxide film. After an undoped oxide film(2) of a thin thickness is deposited on the bit line or capacitor, a doped oxide film of a thick thickness is deposited on the undoped oxide film. A photoresist mask pattern(5) is formed on the doped oxide film, and the doped oxide film is isotropic-etched using an HF vapor of a low pressure. The residue doped oxide film and the undoped oxide film are etched to form a contact hole(10) exposing the substrate and the bit line or capacitor. When the doped oxide film is etched, a partial pressure is controlled to be below 500 Pascal.
申请公布号 KR100256801(B1) 申请公布日期 2000.05.15
申请号 KR19930011065 申请日期 1993.06.17
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD. 发明人 KIM, MYUNG SEON;LEE, SEOK HEE
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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