发明名称 SELF-ALIGNED CONTACT PAD OF SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: An SAC(self-aligned contact) pad and method for manufacturing the same are provided to improve a reliability, an aspect ratio and an etching selectivity by merging a storage node and a bit line contact regions into T-shape. CONSTITUTION: A gate body structure including a gate conductive layer, multiple gate masks(180,200) and a gate spacer(260) is formed on a semiconductor substrate(100) spaced apart from each other. For forming SAC(self-aligned contact) pads, a mask pattern having T-shaped open region is formed. Using the mask pattern, interlayer dielectrics(360) are etched to expose the semiconductor substrate(100), wherein the second layer(200) of the gate mask is under-cut. After filling a pad conductive layer a flattening etching process is performed using the second layer(200) of the gate mask as an etch stopper, thereby SAC contact pads(460a,460b) are formed.
申请公布号 KR20000026138(A) 申请公布日期 2000.05.15
申请号 KR19980043524 申请日期 1998.10.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JAE GU;JEONG, TAE YOUNG;CHO, CHANG HYUN
分类号 H01L21/28;H01L21/60;H01L21/768;H01L21/8242;H01L23/485;(IPC1-7):H01L21/28 主分类号 H01L21/28
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