发明名称 |
SELF-ALIGNED CONTACT PAD OF SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: An SAC(self-aligned contact) pad and method for manufacturing the same are provided to improve a reliability, an aspect ratio and an etching selectivity by merging a storage node and a bit line contact regions into T-shape. CONSTITUTION: A gate body structure including a gate conductive layer, multiple gate masks(180,200) and a gate spacer(260) is formed on a semiconductor substrate(100) spaced apart from each other. For forming SAC(self-aligned contact) pads, a mask pattern having T-shaped open region is formed. Using the mask pattern, interlayer dielectrics(360) are etched to expose the semiconductor substrate(100), wherein the second layer(200) of the gate mask is under-cut. After filling a pad conductive layer a flattening etching process is performed using the second layer(200) of the gate mask as an etch stopper, thereby SAC contact pads(460a,460b) are formed. |
申请公布号 |
KR20000026138(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980043524 |
申请日期 |
1998.10.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JAE GU;JEONG, TAE YOUNG;CHO, CHANG HYUN |
分类号 |
H01L21/28;H01L21/60;H01L21/768;H01L21/8242;H01L23/485;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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