发明名称 |
ROW REPAIR APPARATUS |
摘要 |
PURPOSE: A row repair apparatus is provided to decrease a chip size and to enhance a competitive power by using one word line boosting signal generating unit in one memory cell array. CONSTITUTION: Memory cell array blocks(MC0-MC3) have different block addresses each other and are divided by a block selecting address. Word line boosting signal generating unit(34-40) are arranged to corresponding memory cell array blocks(MC0-MC3) and are connected to a redundancy word line of two or more memory cell array block in common. Word line boosting signal generating unit(34-40) provides a word line boosting signal(px) to a redundancy word line driver of the selected memory cell array block when performing a repair. Word line boosting signal generating unit(34-40) provides the word line boosting signal(px) to a normal word line driver of the selected memory cell array block when not performing the repair. A repair information generating unit(42) programs a repair address and provides repair information to corresponding word line boosting signal generating unit(34-40).
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申请公布号 |
KR20000027617(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045572 |
申请日期 |
1998.10.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
JO, JOO HWAN |
分类号 |
G11C29/00;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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