发明名称 METHOD FOR FORMING UPPER ELECTRODE OF CAPACITORS
摘要 PURPOSE: A method for forming an upper electrode is provided to reduce a leakage current and improve an interface property between a dielectric layer and the upper electrode by using sputtering in oxygen atmosphere. CONSTITUTION: A method comprises the steps of forming a first metal layer(22) on a dielectric layer(21) of capacitor by firstly sputtering method, and forming a second metal layer(23) on the first metal layer(22) by secondly sputtering method. The first sputtering is performed at 100% Ar atmosphere, and the second sputtering is performed in oxygen atmosphere contained O2. The first and the second metal layers(22,23) are composed of Pt, Ir, Ru, or Rh.
申请公布号 KR20000027401(A) 申请公布日期 2000.05.15
申请号 KR19980045317 申请日期 1998.10.28
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 SEO, CHUNG WON
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址
您可能感兴趣的专利