发明名称 |
METHOD FOR MANUFACTURING SOI TRANSISTOR |
摘要 |
PURPOSE: A method for manufacturing an SOI(Silicon On Insulator) transistor is provided to manufacture a transistor with a structure of an SOI. CONSTITUTION: A method for manufacturing an SOI transistor comprises the following steps. A first oxidation film with a hole of a constant depth is formed on a silicon substrate(100). A first gate conductive film is formed within the hole. A part of the oxidation film is etched to expose a predetermined portion of an upper portion of the first gate conductive film. A second oxidation film(140) is formed on the exposed portion of the first gate conductive film. A silicon film(150') with a constant thickness is formed on the first and the second oxidation films. A gate oxidation film(160) and a second gate conductive film are formed on the silicon film. A spacer(180) is formed on a side wall of the second gate conductive film. A source area(190) and a drain area(200) are formed on a selected area of the silicon film. A silicide layer( is formed on the second gate conductive film, the source area, and the drain area.
|
申请公布号 |
KR20000027722(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045721 |
申请日期 |
1998.10.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, IL GWON |
分类号 |
H01L21/20;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|