发明名称 METHOD FOR MANUFACTURING SOI TRANSISTOR
摘要 PURPOSE: A method for manufacturing an SOI(Silicon On Insulator) transistor is provided to manufacture a transistor with a structure of an SOI. CONSTITUTION: A method for manufacturing an SOI transistor comprises the following steps. A first oxidation film with a hole of a constant depth is formed on a silicon substrate(100). A first gate conductive film is formed within the hole. A part of the oxidation film is etched to expose a predetermined portion of an upper portion of the first gate conductive film. A second oxidation film(140) is formed on the exposed portion of the first gate conductive film. A silicon film(150') with a constant thickness is formed on the first and the second oxidation films. A gate oxidation film(160) and a second gate conductive film are formed on the silicon film. A spacer(180) is formed on a side wall of the second gate conductive film. A source area(190) and a drain area(200) are formed on a selected area of the silicon film. A silicide layer( is formed on the second gate conductive film, the source area, and the drain area.
申请公布号 KR20000027722(A) 申请公布日期 2000.05.15
申请号 KR19980045721 申请日期 1998.10.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, IL GWON
分类号 H01L21/20;(IPC1-7):H01L21/20 主分类号 H01L21/20
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