发明名称 SEMICONDUCTOR MEMORY DEVICES
摘要 PURPOSE: A semiconductor memory device is provided to reduce sub-threshold leakage currents by applying bias having different levels to cell plate in accordance with stand-by and active modes. CONSTITUTION: A power consumption due to sub-threshold leakage is reduced by controlling a cell plate voltage at stand-by mode. The memory device comprises a cell capacitor(22) having a plate node(10) and a storage node(12), a cell transistor(14) for connecting the cell capacitor(22) and a bit line(24) according to enable state of a word line(16), and a cell plate voltage controller(20). The cell plate voltage controller(20) is applied a bias for holding a gate-source voltage of the cell transistor(14) to a negative to the plate node(10) when the cell transistor(14) is turn-off (that is, stand-by mode).
申请公布号 KR20000027646(A) 申请公布日期 2000.05.15
申请号 KR19980045603 申请日期 1998.10.28
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 EUN, JONG OH;BAE, JAE WOOK
分类号 H01L27/10;(IPC1-7):H01L27/10 主分类号 H01L27/10
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