发明名称 |
SEMICONDUCTOR MEMORY DEVICES |
摘要 |
PURPOSE: A semiconductor memory device is provided to reduce sub-threshold leakage currents by applying bias having different levels to cell plate in accordance with stand-by and active modes. CONSTITUTION: A power consumption due to sub-threshold leakage is reduced by controlling a cell plate voltage at stand-by mode. The memory device comprises a cell capacitor(22) having a plate node(10) and a storage node(12), a cell transistor(14) for connecting the cell capacitor(22) and a bit line(24) according to enable state of a word line(16), and a cell plate voltage controller(20). The cell plate voltage controller(20) is applied a bias for holding a gate-source voltage of the cell transistor(14) to a negative to the plate node(10) when the cell transistor(14) is turn-off (that is, stand-by mode).
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申请公布号 |
KR20000027646(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045603 |
申请日期 |
1998.10.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
EUN, JONG OH;BAE, JAE WOOK |
分类号 |
H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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地址 |
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