发明名称 DEFECT ANALYZER
摘要 PROBLEM TO BE SOLVED: To display both an accurate creation record of defect information and a defect analysis result on a screen by using an image of an inspection object in combination with mounting location coordinate data of each component. SOLUTION: A controller 5 reads defect data on a required printed circuit board, calculates a cumulative defect occurrence number of each component, and creates chief inspection component data comprising component names, locations and mounting location coordinates of the top 10 components. Simultaneously, the controller 5 reads image data and coordinate data of the required printed circuit board from a memory part 2, and displays an image of an inspection printed circuit board on a touch monitor 4. The controller 5 creates defect data associated with a board name, a failed component name, mounting coordinates, a defect kind and a defect data input date and time according to a prescribed process, and records the created defect data into the memory part 2. In analysis, the controller 5 converts the mounting coordinates of the stored defect data in the memory part 2 into image coordinates by use of a specific expression, and displays a defect occurrence frequency display area on each the component of the image of the printed circuit board.
申请公布号 JP2000131242(A) 申请公布日期 2000.05.12
申请号 JP19980302000 申请日期 1998.10.23
申请人 HITACHI LTD 发明人 MATSUSHITA ATSUYUKI
分类号 H05K13/08;G01N21/88;G01N21/93 主分类号 H05K13/08
代理机构 代理人
主权项
地址