| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of detecting whether a block failure has occurred or not prior to the implementation of a burn-in test. SOLUTION: A semiconductor testing device 1 tests a semiconductor device 3, which is an object to be tested, for predetermined electric characteristics. Test data storing memory 6 stores the results of the test on the predetermined electric characteristics as test data. Memory 5 for storing failure occurrence patterns stores failure occurrence patterns of block failures which can occur in a burn-in board 2 in advance. A CPU 8 as a test data storing means detects a block failure by checking the test data stored in the test data storing memory 6 against the failure occurrence patterns stored in the memory 5 for storing failure occurrence patterns and determining a block failure in the case that test data similar to a failure occurrence pattern is present. The result of the determination is displayed on a display 9.
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