发明名称 LENS METER
摘要 PROBLEM TO BE SOLVED: To provide a lens meter for measuring the center thickness of a lens by utilizing an existing configuration without using any instrument such as a vernier calipers and at the same time obtaining the refractive index of the lens from the center thickness. SOLUTION: A lens meter is provided with an operation control circuit 23 for obtaining the optical characteristics of a lens L to be inspected based on an output signal from line sensors 21 and 22 by projecting measurement luminous flux that is transmitted through the lens L to be inspected to the line sensors 21 and 22 (light reception means). The lens meter is also provided with a marking point device 25 for outputting dimension data by measuring the curvature shape, thickness, and the like of the refraction surface of the lens L to be inspected, and at the same time the operation control circuit 23 is designed to obtain the refractive index of the lens L to be inspected from the dimension data and the optical characteristics of the operation control circuit 23.
申请公布号 JP2000131190(A) 申请公布日期 2000.05.12
申请号 JP19980304054 申请日期 1998.10.26
申请人 TOPCON CORP 发明人 KOBAYASHI SHINICHI;YANAGI HIDEKAZU
分类号 G01M11/00;G01M11/02;(IPC1-7):G01M11/02 主分类号 G01M11/00
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