发明名称 THICKNESS DETECTOR FOR PLATE TYPE PRODUCT
摘要 PROBLEM TO BE SOLVED: To provide a thickness detector with superior detection precision which can properly detect when the dimension in thickness direction of a plate type product varies due to adhesion of foreign matter such as dust on the plate type product. SOLUTION: The detector is provided with a product receiver stage 9 touching one surface 5A on one side of a plate type product 5 in producing process, a press plate energized to reciprocally move in a direction perpendicular to the surface touching to press a plate type product 5 in producing process, a press plate 13 freely controllable with parallelism to the other surface 5B so that the press surface touches along the other surface 5B of the plate type product 5, and a measuring means for measuring dimensions G1 and G2 concerning the gap between the surface 9A of product receiver stage 9 and the press surface 13B at the position in plate type product 5 at least a plurality of locations near the peripheral edge of a plate type product 5.
申请公布号 JP2000131010(A) 申请公布日期 2000.05.12
申请号 JP19980302815 申请日期 1998.10.23
申请人 SEIKO EPSON CORP 发明人 TAKASHIMA NAGAMITSU;OGAWA SATORU;GOTO TSUTOMU;SAITO NAOKI;ANADA YOICHI
分类号 G01B7/00;G01B7/06;(IPC1-7):G01B7/06 主分类号 G01B7/00
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