| 摘要 |
PROBLEM TO BE SOLVED: To reduce a manufacturing cost and to allow a contact resistance of a probe main body against an objet to be probed to be constant. SOLUTION: A contact probe device 1 is provided with a base part 3 to be attached to a probe guiding mechanism, and first and second contact probes 2a and 2b provided while a probe main body Pa, with its base-end part side fixed to the base part 3 respectively, made to contact an object to be probed according to the guide of a probe guiding mechanism being insulated from the tip-end part side each other. Here, both contact probes 2a and 2b are fixed to the base part 3 so that each tip-end part side energizes each other in facing direction. Thus, the tip end part of the probe main body is aligned very easily, reducing a manufacturing cost.
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