发明名称 INFRARED TEMPERATURE MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To make an infrared detector usable as a calibration reference heat source for the temp. measurement by providing a means for controlling the temp. for constant temp. and a means for opening/closing a mirror-surface finished shutter and picking up the reflected image of the infrared detector. SOLUTION: By having a shutter 4 slide along a plane at right angles to the incident optical axis of an infrared ray radiated by an object to be measured, the shutter is opened/closed. When the shutter 4 is closed, an infrared detector 2 picks up the image of the detector 2 itself which is reflected on the shutter 4. A correcting means for obtaining a correct temp. value accurately controls the temp. of the detector 2 for a constant temp., instead of a reference heat source 3. Thus, without using an exclusive reference heat source, the temp. can be measured similar to the conventional apparatus. Although the shutter 4 is shown with one sheet, but a plurality of shutters may be used. Thus the apparatus can be downsized and a more accurate temp. measurement can be made by working the shutter 4 into a recessed shape.
申请公布号 JP2000131149(A) 申请公布日期 2000.05.12
申请号 JP19980301935 申请日期 1998.10.23
申请人 MITSUBISHI ELECTRIC CORP 发明人 YAMAGISHI AKIRA
分类号 G01J1/02;G01J5/48;(IPC1-7):G01J5/48 主分类号 G01J1/02
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