发明名称 HIGH BREAKDOWN VOLTAGE SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a high breakdown voltage semiconductor element whose ON-resistance is low. SOLUTION: This high breakdown voltage semiconductor element has a part where N-type layers and P-type layers are alternately and regularly repeated and arranged between a low resistance layer 11 on the high potential side and a low resistance layer 13 on the low potential side. The N-type P-type layers stretch and exist in the direction connecting the low resistance layer on the high potential side with the low resistance layer on the low potential side. When a high voltage is applied, the alternating N-type P-type layers are turned into depletion and support the high voltage. This semiconductor element has a part where heavily-doped N-type layers 16 and heavily-doped P-type layers 15 are repeatedly in contact with each other. At least between the heavily-doped N-type layers or between the heavily-doped P-type layers, semiconductor layers 10 of lightly-doped or insulating layers 14 are interposed.
申请公布号 JP2000133801(A) 申请公布日期 2000.05.12
申请号 JP19980305368 申请日期 1998.10.27
申请人 TOSHIBA CORP 发明人 NAKAGAWA AKIO
分类号 H01L29/06;H01L29/78 主分类号 H01L29/06
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