发明名称 Driver characteristics evaluation method for IC driver circuit
摘要 .The driver characteristics evaluation method is effected by bringing a capacitance (C1) connected to the output (OUT) of the driver circuit (DRV) to a given potential, with activation of the driver circuit at a given test point, so that a current flows between the output and the capacitance. This current is interrupted at a second time point and the potential at the capacitance measured and evaluated as a measure of the driver characteristics. The capacitance may be set initially to earth potential, with subsequent measurement of the capacitance potential via an evaluation stage (INV,COMP) within the IC.
申请公布号 DE19843432(C1) 申请公布日期 2000.05.11
申请号 DE19981043432 申请日期 1998.09.22
申请人 SIEMENS AG 发明人 SCHNEIDER, HELMUT;SCHAMBERGER, FLORIAN
分类号 G01R31/28;(IPC1-7):G01R31/318;G01R27/26 主分类号 G01R31/28
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