发明名称 |
Driver characteristics evaluation method for IC driver circuit |
摘要 |
.The driver characteristics evaluation method is effected by bringing a capacitance (C1) connected to the output (OUT) of the driver circuit (DRV) to a given potential, with activation of the driver circuit at a given test point, so that a current flows between the output and the capacitance. This current is interrupted at a second time point and the potential at the capacitance measured and evaluated as a measure of the driver characteristics. The capacitance may be set initially to earth potential, with subsequent measurement of the capacitance potential via an evaluation stage (INV,COMP) within the IC.
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申请公布号 |
DE19843432(C1) |
申请公布日期 |
2000.05.11 |
申请号 |
DE19981043432 |
申请日期 |
1998.09.22 |
申请人 |
SIEMENS AG |
发明人 |
SCHNEIDER, HELMUT;SCHAMBERGER, FLORIAN |
分类号 |
G01R31/28;(IPC1-7):G01R31/318;G01R27/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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