发明名称 Process for laser soldering and for temperature monitoring of semi-conductor chips, and chip cards manufactured according to this process
摘要 A laser beam (32) heats solder (12) applied to a solder point to melting point, and interrupts the beam. The laser beam is applied to the reverse side of a packageless semiconductor chip (10) opposite the side with the solder point. Solder of at least two solder points may be heated simultaneously, or all solder points may be heated at the same time. The laser may be applied for 0.1 to 0.5 seconds, with a focus diameter of 0.1 to 2.0 mm at a power of up to about 10 W. An Independent claim for a method of ending a soldering process during laser soldering of a semiconductor chip is also included. A chip card is also claimed.
申请公布号 EP0999729(A2) 申请公布日期 2000.05.10
申请号 EP19990121094 申请日期 1999.10.22
申请人 HAHN-SCHICKARD-GESELLSCHAFT FUER ANGEWANDTE FORSCHUNG E.V. 发明人 ALAVI, MANI, DR. RER. NAT., DIPL.-ING.;SCHEITHAUER, HERMANN, DIPL.-PHYS.;SCHMIDT, BERTRAM, PROF. DR. DIPL.-PHYS.;SCHUMACHER, AXEL, DIPL.-PHYS.
分类号 B23K1/005;H01L21/60;H05K3/34 主分类号 B23K1/005
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