发明名称 Field shield isolated transistor
摘要 A field shield isolated transistor is provided wherein the left-hand edge (E1) of a left-hand contact pad (51a) is positioned a distance (d5) to the right of the left-hand edge (F1) of a left-hand field shield gate electrode (41); the right-hand edge (E2) of the left-hand contact pad (51a) is positioned a distance (d6) to the right of the right-hand edge (F2) of the left-hand field shield gate electrode (41); the left-hand edge (E3) of a right-hand contact pad (52a) is positioned a distance (d7) to the left of the left-hand edge (F3) of a right-hand field shield gate electrode (42); and the right-hand edge (E4) of the right-hand contact pad (52a) is positioned a distance (d8) to the left of the right-hand edge (F4) of the right-hand field shield gate electrode (42). The right-hand edge (E2) of the left-hand contact pad (51a) and the left-hand edge (E3) of the right-hand contact pad (52a) which are positioned closer to diffusion layers (21-23) reduce the size of the MOS transistor, achieving the effective use of the area thereof.
申请公布号 US6060764(A) 申请公布日期 2000.05.09
申请号 US19970985913 申请日期 1997.12.05
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MAEDA, SHIGENOBU
分类号 H01L21/76;H01L21/82;H01L23/58;H01L27/118;(IPC1-7):H01L23/58 主分类号 H01L21/76
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