发明名称 X-RAY INSPECTING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspecting instrument which has a compact structure using a simple means. SOLUTION: In an X-ray inspecting instrument which includes a patient table 1, an X-ray fluoroluscent image intensifier 61 on a first carriage 6 displaceable in the longitudinal direction of the table, an overtable X-ray source 2 aligned to the intensifier and an image recording means 71 displaceable on a second carriage 7, there are driving system 8 and 9. The second carriage is moved quickly to a standby position and then quickly to an exposure position. The second carriage can be displaced in the longitudinal direction of the table independently of the first carriage and in the first mode of the operation, the two carriages are driven synchronously and in the second mode of the operation, the second carriage is displaced with respect to the first carriage.
申请公布号 JP2000126165(A) 申请公布日期 2000.05.09
申请号 JP19990301111 申请日期 1999.10.22
申请人 KONINKL PHILIPS ELECTRONICS NV 发明人 CSIKOS JANOS;MEDGYESI GYOERGY;BARNAVARI ATTILA
分类号 A61B6/00;G03B42/02;(IPC1-7):A61B6/00 主分类号 A61B6/00
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