| 摘要 |
The present invention is directed to a method for determining the halogen toxicity level in a sample containing halogenated compounds, specifically halogen containing rubbers by utilizing thermal electrons formed inside a mass spectrometer operated at negative ion electron capture conditions. The method allows for detection of the toxic species from the parts per million level, down to the parts per billion levels. The method comprises the steps of (a) ionizing a reagent gas capable of producing thermal electrons having a thermal energy of 0 to 10 eV with the a polychromatic ion source of a mass spectrometer to produce thermal electrons having thermal energy of 0 to 10 eV, (b) capturing said thermal electrons with a halogen containing compound to form halogen atomic anions or halogen atomic cluster anions wherein said halogen containing compound has been passed through a gas chromatograph prior to said capturing of thermal electrons and wherein a mass spectrogram is obtained following said capturing of electrons, (c) speciating and quantifying said halogen atomic anions or halogen atomic cluster anions using a mass chromatogram produced from a combination of said gas chromatography and said mass spectrometer.
|
