发明名称 Methods of treating a semiconductor wafer
摘要 A method for coating a surface of a substrate material, such as a semiconductor wafer. The method includes providing a host controller, providing a self-controlled treatment module, connecting the self-controlled treatment module to the host controller, issuing treatment instructions from the host controller to the self-controlled treatment module, receiving the treatment instruction from the host controller at the self-controlled treatment module, and controlling the treatment of the material with the self-controlled treatment module to maintain compliance with the treatment instruction.
申请公布号 US6061605(A) 申请公布日期 2000.05.09
申请号 US19970951176 申请日期 1997.10.15
申请人 MICRON TECHNOLOGY, INC. 发明人 DAVIS, SHAWN D.
分类号 G03F7/16;H01L21/00;H01L21/677;(IPC1-7):G06F19/00;G06G7/66 主分类号 G03F7/16
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