发明名称 Method of manufacturing a semiconductor substrate having a dielectric isolation structure
摘要 <p>In accordance with this invention, in manufacturing a semiconductor substrate having a dielectric isolation structure, an approach is employed to form a dielectric film at a semiconductor layer (32) formed by epitaxial growth and grooves for carrying out dielectric isolation to deposit filler (36) thereon thereafter to polish the deposited filler by using the polishing condition where the polishing rate ratio of the filler to the dielectric film is one fifth or less. Thus, an active semiconductor layer where elements are to be formed can be provided with good productivity under the state where the flatness thereof is good and the layer thickness is uniformly and precisely controlled. <IMAGE> <IMAGE></p>
申请公布号 EP0488230(B1) 申请公布日期 2000.05.03
申请号 EP19910120294 申请日期 1991.11.27
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HOSHI, TADAHIDE
分类号 H01L21/74;H01L21/321;H01L21/762;H01L21/763;(IPC1-7):H01L21/76 主分类号 H01L21/74
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