发明名称 Wafer edge deplater for chemical mechanical polishing of substrates
摘要 A device for electrochemically deplating metal from side edges and a backside of a semiconductor wafer or substrate. The device includes a shaped cathode having a shape substantially corresponding to a shape of at least a portion of the semiconductor wafer, such that the shaped cathode at least partially covers the backside and at least partially covers the side edges of the semiconductor wafer. The position of at least one of the semiconductor wafer and the shaped cathode is altered by position altering apparatus during the electrochemical deplating.
申请公布号 US6056869(A) 申请公布日期 2000.05.02
申请号 US19980090736 申请日期 1998.06.04
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 UZOH, CYPRIAN EMEKA
分类号 C25F5/00;C30B33/00;H01L21/321;(IPC1-7):C30B30/02 主分类号 C25F5/00
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