发明名称 Shielded bit line sensing scheme for nonvolatile semiconductor memory
摘要 A memory incorporates a shield bit line reading system for fixing one of two bit lines disposed adjacent to each other to a shield potential and reading data to the other bit line. Selected bit lines are precharged to a power source potential, and then brought to a floating state. The shield bit lines are fixed to the power source potential. A period in which the power source potential is applied to the selected bit lines and a period in which the power source potential is applied to the shield bit lines are the same. A source line decoder applies the power source potential to sources of NAND cell units connected to selected bit lines and applies a ground potential to sources of NAND cell units connected to shield bit lines. Then, an output of data is produced from the memory cell to the selected bit lines.
申请公布号 US6058044(A) 申请公布日期 2000.05.02
申请号 US19980207929 申请日期 1998.12.09
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SUGIURA, YOSHIHISA;IWATA, YOSHIHISA;WATANABE, HIROSHI
分类号 G11C16/02;G11C16/04;G11C16/26;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/04 主分类号 G11C16/02
代理机构 代理人
主权项
地址