发明名称 Method of manufacturing semiconductor device
摘要 An N-type impurity is ion-implanted in the exposed surface of a semiconductor substrate, thereby forming N-type diffusion layers. A P-type impurity is ion-implanted in the semiconductor substrate covered with a cover film, thereby forming P-type diffusion layers. A compound film of a semiconductor and a metal is formed on each of the surfaces of the N-type and P-type diffusion layers.
申请公布号 US6057185(A) 申请公布日期 2000.05.02
申请号 US19960705656 申请日期 1996.08.30
申请人 SONY CORPORATION 发明人 SUENAGA, JUN
分类号 H01L21/28;H01L21/8238;H01L27/092;(IPC1-7):H01L21/823 主分类号 H01L21/28
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