| 摘要 |
<p>A technique is disclosed for identifying potentially defective circuitry associated with discrete pixel regions in an imaging system detector. Signals representative of the pixels in an image matrix are generated (42). The signals are analyzed (44) to identify mean and standard deviation values from a histogram of the pixel population (82) . Pixels lying outside of a desired range, such as a distribution envelope determined the histogram, are compared (84) to the mean value plus or minus a multiple of the standard deviation. Pixels lying outside of the desired range are labelled or masked (90) as potentially defective. <IMAGE></p> |
