发明名称 Slurry supply system for chemical mechanical polishing
摘要 A chemical mechanical polishing apparatus for semiconductor wafers that ensures uniform planarization of said wafers is described. Said chemical mechanical polishing apparatus comprises a slurry supply system that channels slurry through the platen and pad, and a carrier head with provision to hold the wafer. The pad contains grooves for uniform distribution of the slurry under the rotating wafer thus eliminating uneven planarization as in prior art.
申请公布号 US6056851(A) 申请公布日期 2000.05.02
申请号 US19980134549 申请日期 1998.08.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY 发明人 HSIEH, SHIH-HUANG;CHEN, LI-DUM
分类号 B24B37/04;B24B57/02;B24D13/14;(IPC1-7):B24B21/04 主分类号 B24B37/04
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