发明名称 Electrooptic voltage waveform measuring apparatus having an electrooptic element with an electrooptic effect
摘要 An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic element. The electrooptic voltage waveform measuring apparatus further includes a polarization analyzer for analyzing a polarization state of the light passed through the electrooptic element and detecting a voltage waveform of the object; a second electrode mounted on the electrooptic element and separated from the first electrode; and an amplifier having an input terminal coupled to the second electrode and outputting a low-frequency component of the voltage waveform of the object. The electrooptic voltage waveform measuring apparatus further includes a voltage waveform combining processor obtaining a measured voltage waveform of the object by combining a high-frequency component of the voltage waveform of the object obtained from an output of the polarization analyzer and the low-frequency component of the voltage waveform of the object output from the amplifier.
申请公布号 US6057677(A) 申请公布日期 2000.05.02
申请号 US19970844995 申请日期 1997.04.23
申请人 FUJITSU LIMITED 发明人 WAKANA, SHIN-ICHI;MIYAMOTO, AKINORI;HAMA, SOICHI;OZAKI, KAZUYUKI;NAGAI, TOSHIAKI
分类号 G01R13/34;G01R31/308;(IPC1-7):G01R31/308 主分类号 G01R13/34
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