| 摘要 |
PURPOSE: A device for automatically correcting a timing signal of a memory tester is provided to automatically correct by making feedback a delayed width to a signal generating source using a circuit capable of measuring a signal delay. CONSTITUTION: The correction device includes a timing generating portion(101) and a comparing portion(102). The timing generating portion outputs a timing signal applied for a memory device test, and a delay controls it according to a delay control signal. The comparing portion compares a timing signal outputted from the timing generating portion to a reference signal which is previously established for measuring delay of a timing signal automatically and generates the delay controlling signal according to the result of the comparison and, in addition, outputs the timing signal adjusted by the delay controlling signal to a memory(103).
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