发明名称 SEMICONDUCTOR ASSEMBLING METHOD AND APPARATUS
摘要 <p>A semiconductor assembling method joins a bonding wire with a bonding object by pressing the bonding wire against the bonding object with a bonding pressurizing tool and by effecting at least one junction process of thermal junction or ultrasonic junction. The method includes steps of measuring a time elapsing from a last bonding process to a subsequent bonding process or a temperature of the pressurizing tool, and changing at least one junction condition of pressurizing force, pressurizing time, ultrasonic oscillation output, and ultrasonic oscillation time for the subsequent bonding process, based on the measured time. A semiconductor assembling apparatus includes a measuring device for measuring the time or temperature and a junction condition changing device for changing the condition to perform the method.</p>
申请公布号 KR100254570(B1) 申请公布日期 2000.05.01
申请号 KR19960034155 申请日期 1996.08.19
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO.,LTD. 发明人 NAGAI, YOSHIYOOKI;EKOOCHI, SHINJO
分类号 H01L21/60;H01L21/44;H01L21/603;H01L21/607;(IPC1-7):H01L21/60 主分类号 H01L21/60
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