发明名称 |
METHOD FOR ETCHING IR ELECTRODE |
摘要 |
PURPOSE: A method for etching an iridium layer is provided to form a fine pattern on an iridium layer by using a titanium layer or a titanium nitride layer as an etching mask. CONSTITUTION: An interlayer dielectric(101) is deposited on a semiconductor substrate(100). A contact hole for exposing the semiconductor substrate(100) is formed on the interlayer dielectric(101). A conductive plug(105) is formed to fill the contact hole. An iridium layer(109) is deposited to cover the conductive plug(105). One layer selected from a titanium layer and a titanium nitride layer is formed on the iridium layer. The selected layer is patterned. The iridium layer(109) is etched by using the patterned layer as an etching mask and an etching gas with a high etching selection ratio.
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申请公布号 |
KR100255660(B1) |
申请公布日期 |
2000.05.01 |
申请号 |
KR19970002680 |
申请日期 |
1997.01.29 |
申请人 |
SAMSUNG ELECTRONICS CO.,LTD. |
发明人 |
NAM, BYUNG-YOON |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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