发明名称 CONNECTING STRUCTURE OF BUS LINE IN THIN FILM TRANSISTOR AND THE METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: A wire interconnection structure and a method for manufacturing the same are provided to simplify the process of interconnecting a plurality of metal layers overlapped with an insulating film interleaved therebetween. CONSTITUTION: A method for manufacturing a wire interconnection structure deposits a metal including aluminum on an insulating substrate(111). The metal is patterned to form a gate wire(115). Insulating materials such as oxide silicon or nitride silicon are deposited on the entire surface of the substrate in which the gate wire(115) is formed to form a gate insulating film(119). Chromium or chromium alloy, etc. are deposited on the gate insulating film(119) and are then patterned to form a source wire(135). A portion of the source wire(135) overlapped with the gate wire(115) is removed to form a contact hole. With a portion of the gate wire(115) and the side of the source wire(115) exposed via the contact hole, indium-tin-oxide is deposited and is then patterned to form an interconnection terminal(153).
申请公布号 KR100255591(B1) 申请公布日期 2000.05.01
申请号 KR19970007401 申请日期 1997.03.06
申请人 LG.PHILIPS LCD CO.,LTD. 发明人 AHN, BYUNG-CHUL
分类号 H01L21/28;H01L23/522;H01L23/532;(IPC1-7):H01L21/28 主分类号 H01L21/28
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