发明名称 |
PLANE TYPE ELECTRONIC PROBE |
摘要 |
PURPOSE: A flat integral electromagnetic field probe is provided to measure electric and magnetic fields at the same time in a wide band by having two probes on a dielectric substrate. CONSTITUTION: Two probes(12) having opposed semicircle shapes are formed on a dielectric substrate(11). The probes(12) are printed on the substrate with a diameter of 1cm and a width of 1mm according to a silk screen scheme, and made through binder burn-out and sintering to remove organic materials added during a process step of preparing slurry. Two load resistances(13) are inserted between the probes(12) to electrically connect the probes(12). The load resistances(13) are connected with the connector inner cores and lead lines. Magnetic and electric fields are obtained by respectively using a sum signal and a difference signal applied to both ends of the resistances.
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申请公布号 |
KR100255563(B1) |
申请公布日期 |
2000.05.01 |
申请号 |
KR19970060665 |
申请日期 |
1997.11.17 |
申请人 |
KOREA ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
LEE, AE KYOUNG;CHOI, IK GWON;CHO, KWONG YUN;YUN, YOUNG GUN |
分类号 |
G01R1/067;(IPC1-7):G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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