发明名称 STRUCTURE OF SEMICONDUCTOR MEMORY DEVICE FORMED BY USE OF FERROELECTRIC SUBSTANCE
摘要 PROBLEM TO BE SOLVED: To enable a semiconductor memory device where a ferroelectric substance is used to be enhanced in degree of integration by a method wherein a cell is lessened in area so as to realize a finer cell structure. SOLUTION: A semiconductor memory device is equipped with a ferroelectric film, the ferroelectric film is pinched in between the two opposed electrodes for the formation of a capacitor, the capacitor is capable of holding binary data on a direction in which the ferroelectric film is polarized, a non-volatile semiconductor memory device is equipped with a structure where the capacitor is connected to the source or drain of a control transistor, the adjacent control transistors are possessed of bit lines in common, also the adjacent capacitors are possessed of plate lines in common, and the above capacitors are arranged above the control transistors.
申请公布号 JP2000124409(A) 申请公布日期 2000.04.28
申请号 JP19980296770 申请日期 1998.10.19
申请人 OKI ELECTRIC IND CO LTD 发明人 TANI KOICHI
分类号 H01L27/10;G11C11/22;H01L21/8242;H01L27/108 主分类号 H01L27/10
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