发明名称 APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTORS
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and a method for manufacturing semiconductors by which the occurrence in which the resulting products of reaction adhering to the device fall down and damages to wafers is prevented. SOLUTION: A semiconductor device manufacturing apparatus is provided with reactive gas ports 11 and 12 provided at the central part of a dispersion head H to which a wafer 17 faces opposite and from which a reaction gas is blown out towards the wafer 17, shield gas ports 14 which are provided around the ports 11 and 12 and from which a shield gas is blown out, and exhaust ports 13 which are provided around the ports 14 and from which un- reacted gases and resulting products of reaction are discharged. The shield gas ports 14 are inclined toward the exhaust ports 13.
申请公布号 JP2000124208(A) 申请公布日期 2000.04.28
申请号 JP19980307805 申请日期 1998.10.15
申请人 NEC KYUSHU LTD 发明人 HONDA TOSHIYUKI
分类号 H01L21/31;C23C16/44;C23C16/455;(IPC1-7):H01L21/31 主分类号 H01L21/31
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