发明名称 INFRARED MICROSCOPE
摘要 <p>PROBLEM TO BE SOLVED: To provide an infrared microscope in which a polarizer is moved and rotated in an optical path by the slit operation of a variable aperture. SOLUTION: The variable aperture 50 is constituted of a pair of slits 21 movable in a casing 22 in Y-direction and a slit 20 on one hand and a slit 24 with a polarizer on which a polarizer is mounted on the other hand in X- direction. Since an aperture 23 is formed at the center by the movement of each slit, it is possible to limit the field of view of infrared measurement. Since the slit 24 with a polarizer in which a polarizer is mounted on one slit can be moved to the center of the aperture 23, it is possible to observe polarization with visible light by a polarizer by mounting an infrared micro-spectral or visible light polarizer at this time. Since the slit 24 with a polarizer can be rotated together with the casing 22, it is possible to catch information from a sample at the angle of polarization. A mechanism capable of automatic operation by an external force such as a motor under the control of a personal computer is provided. However, it is possible to release the mechanism and to operate manually.</p>
申请公布号 JP2000121553(A) 申请公布日期 2000.04.28
申请号 JP19980289665 申请日期 1998.10.12
申请人 SHIMADZU CORP 发明人 TANAKA TOYOHIKO
分类号 G01J3/45;G01N21/27;G01N21/35;(IPC1-7):G01N21/27 主分类号 G01J3/45
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