发明名称 ELECTRICAL CHIP DETECTOR THAT CAN BE TESTED
摘要 <p>PROBLEM TO BE SOLVED: To gather a chip-shaped, conductive material and to given a warning on parts fracture by arranging a magnet for attracting a metal chip between positive and negative contacts being separated by a chip gap. SOLUTION: A magnet 22 is arranged between two contacts 12 and 14. When a metal chip gathers at the magnet 22 and is integrated and then a gap 18 is crosslinked by the chip, current flows between the contacts 12 and 14 and a chip detector circuit becomes a closed circuit, thus generating a warning signal using a signal means. Also, when an electric resistor is added to the chip detector circuit and the chip gathers at the gap 18 and then circuit resistance drops and reaches a preset value, a signal or other warnings are generated, thus reporting the excess of chips and the fracture of parts.</p>
申请公布号 JP2000121744(A) 申请公布日期 2000.04.28
申请号 JP19990286223 申请日期 1999.10.07
申请人 GENERAL ELECTRIC CO <GE> 发明人 WAYNE ERROL MAHON;JOHN RICHARD BIRD
分类号 G01V3/02;G01N27/04;G01N33/28;G01V3/04;(IPC1-7):G01V3/02 主分类号 G01V3/02
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