发明名称 CHARACTER LINE MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To measure a character line efficiently at higher accuracy. SOLUTION: Measuring point group data are obtained along a curved surface containing a character line to be measured (S1). Then, a curved surface is formed to link the measuring point group data smoothly (S2). Subsequently, a luminance data is mapped based on the positions of a light source and a point of sight previously specified for the curved surface generated at the S2 (S4). A part is tracked where the mapped luminance data on the curved surface at the S4 changes (S5) and a curved line indicating the character line is generated by linking point train data smoothly (S6).
申请公布号 JP2000121329(A) 申请公布日期 2000.04.28
申请号 JP19980293549 申请日期 1998.10.15
申请人 MITSUTOYO CORP 发明人 MICHIWAKI HIROKAZU
分类号 G01B11/24;(IPC1-7):G01B11/24 主分类号 G01B11/24
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