发明名称 INTERFERENCE PHASE DETECTING SYSTEM FOR OPTICAL INTERFEROMETER
摘要 PROBLEM TO BE SOLVED: To precisely measure a phase difference corresponding to the distance between stepped parts. even if a reflectivity varies, by rotating a laser beam by a specified angle in accordance with the reflection factor of a measuring plane. SOLUTION: A polarization angle adjusting means 1 rotates a laser beam f0 by a specified angle in accordance with the reflection factor of a measuring plane 3C, and adjusts the polarization angle of a laser beam f1. In accordance with an incident angle (polarization angle) of this laser beam f1, a beam splitter 33 outputs a transmitted laser beam f2 and a reflected laser beam f3 of different intensities. The transmitted laser beam f2 is modulated and becomes a laser beam f4, and the reflected laser beam f3 is also modulated and becomes a laser beam f5. They enter a beam splitter 34 respectively and synthesized, and enter a polarizing beam splitter 3A. A laser beam f4 reflected irradiates a reference plane 3B, and a laser beam f5 transmitted irradiates a measuring plane 3C. And the laser beams f4, f5 reflected respectively enters a photoelectric receiving element 3G, and becomes an electric signal in accordance with the interference component of both laser beams. And a phase difference measuring circuit 3H measures the phase difference between both laser beams in accordance with the level difference of the measuring plane 3C.
申请公布号 JP2000121317(A) 申请公布日期 2000.04.28
申请号 JP19980289741 申请日期 1998.10.12
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 YAMAHA TSUNEO;SERIKAWA SHIGERU;SUZUKI NOBUHIKO
分类号 G01B9/02;G01B11/00;G01B11/30;(IPC1-7):G01B11/00 主分类号 G01B9/02
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