发明名称 METHOD FOR ANALYZING HALIDE ION CONTAINED IN METAL OXIDE
摘要 PROBLEM TO BE SOLVED: To provide a simple and universal analysis method for completely separating a halide ion contained in a metal oxide as an impurity from the metal oxide and for determining the amount of halide ion that exists in the metal oxide as a small amount of impurity. SOLUTION: In the method for analyzing halide ion contained in an oxide of at least one type or two types of elements out of Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, Mo, Ru, Pd, Ag, Cd, In, Sn, Sb, W, Re, Os, Ir, Pt, Pb, and Bi, a metal oxide is heated and reduced in hydrogen atmosphere, thus separating halide ion that exists in the oxide for determination.
申请公布号 JP2000121516(A) 申请公布日期 2000.04.28
申请号 JP19980295251 申请日期 1998.10.16
申请人 SUMITOMO CHEM CO LTD 发明人 INUKAI HIROSHI;SHIRAGAMI NOBORU
分类号 G01N31/00;G01N1/28;G01N27/28;G01N30/06;G01N30/88;(IPC1-7):G01N1/28 主分类号 G01N31/00
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