| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory which can realize relieving a defective word without deteriorating operation speed with less hardware resources investment. SOLUTION: This device is provided with an associative memory section 10 having a memory circuit section storing redundant address information and a comparison circuit section comparing a decoded result with a redundant address and outputting a coincidence detecting signal, pairs of main bit line MBL, XMBL connected through switching circuits 102, 103 arranged in parallel with pairs of regular bit line NBL, XNBL and pairs of redundant bit line ABL, XABL, a sense amplifier circuit 112, and a redundancy detecting circuit 108 inputting a coincidence detecting signal from the associative memory section 107, activating a word line of a correspondent redundant memory, and connecting selectively it to the pairs of main bit lines by the switching circuits 102, 103.
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