发明名称 SEMICONDUCTOR OXIDIZING APPARATUS
摘要 PROBLEM TO BE SOLVED: To obtain a semiconductor oxidizing apparatus which can safely conduct oxidization with high productivity and can prevent deterioration of surfaces due to oxidization. SOLUTION: In a semiconductor oxidizing device which thermally oxidizes a laminated semiconductor body housed in a reaction furnace 1 by using steam flowing in the furnace 1, a means 8 which removes condensed dew water is installed to the furnace 1, and an evacuating means 9 is provided on the downstream the furnace 1. Downstream the furnace 1, a gas removing means 10 for an AsH3 gas and/or a PH3 gas is provided as necessary, in addition to the evacuating means 9. Upstream the furnace 1, in addition, a supply line 12 for the AsH3 gas and/or the PH3 gas is provided, as necessary.
申请公布号 JP2000124213(A) 申请公布日期 2000.04.28
申请号 JP19980296705 申请日期 1998.10.19
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 IWAI NORIHIRO;MUKOHARA TOMOKAZU;KASUKAWA AKIHIKO
分类号 H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/316
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