发明名称 PROGRAMMED ELECTRON FLUX
摘要 A quantity of electrons that will be used in the ionization event in an FTIC R MS is preprogrammed. When the number of electrons produced reaches that number, the electron beam is turned off. This approach assures that the same number of electrons are used for every measurement and eliminates the variations due to fundamental characteristics of the electron source and the variations in temperature due to changing ambient conditions.
申请公布号 CA2345384(A1) 申请公布日期 2000.04.27
申请号 CA19992345384 申请日期 1999.10.13
申请人 SIEMENS APPLIED AUTOMATION, INC. 发明人 LITTLEJOHN, DUANE P.;ARNOLD, ROBERT W.
分类号 H01J49/02;H01J49/38;H01J49/42;(IPC1-7):H01J49/42 主分类号 H01J49/02
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