发明名称 Silicon multi-layer etching, especially for micromechanical sensor production, comprises etching trenches down to buried separation layer, etching exposed separation layer and etching underlying silicon layer
摘要 Silicon multi-layer etching comprises anisotropic plasma etching of trenches (21') down to a buried separation layer (12,14,14',16), etching the exposed separation layer and then etching an underlying silicon layer (17, 17'). Etching of a layered silicon body, having a first silicon layer (15) provided with an etch mask (10), comprises: (a) a first anisotropic plasma etching operation which produces trenches (21') in the region of the mask openings (21) and which terminates at a separation layer (12,14,14',16) buried between the first silicon layer (15) and a further silicon layer (17,17'); (b) a second etching operation for etching through the exposed portions (23,23') of the separation layer; and (c) a third etching operation to etch the further silicon layer (17,17'). Preferred Features: The third etching operation produced complete isotropic under-etching between two or more trenches so that a free standing structure (32) is created. The first etching operation is a dry etching operation comprising alternate deposition and isotropic etching steps, the deposition steps being carried out using a high density plasma (especially a PIE (propagation ion etching) plasma or an ICP (inductively coupled plasma)) of a polymer-forming monomer source gas which forms a Teflon (RTM) like film (20) on the trench side walls, while the etching steps employ a fluorine radical source gas, especially SF6 with added oxygen. The separation layer comprises a first section (12) of silicon dioxide, silicon oxide, silicon nitride, glass and/or ceramic, especially thermally grown silicon dioxide, and a second section (16) of silicon dioxide deposited by CVD especially from silanes. The separation layer sections (12, 16) are 500 nm to 50 mu m (especially 1-10 mu m) thick. The second etching operation is a dry chemical, especially plasma, etching operation or possibly a wet chemical etching operation using dilute hydrofluoric acid. All the etching operations are carried out in a single etching chamber and the etched body is post-treated in an oxygen plasma stripper for ashing of the mask and the residual Teflon (RTM) like film.
申请公布号 DE19847455(A1) 申请公布日期 2000.04.27
申请号 DE19981047455 申请日期 1998.10.15
申请人 ROBERT BOSCH GMBH 发明人 BECKER, VOLKER;LAERMER, FRANZ;SCHILP, ANDREA
分类号 B81C1/00;B81B3/00;H01L21/302;H01L21/3065;(IPC1-7):H01L21/308;H01L49/00 主分类号 B81C1/00
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