发明名称 INTERFEROMETER FOR OPTICAL WAVELENGTH MONITORING
摘要 <p>Interference elements (112, 116, 122) are disclosed for measurement of wavelength in optical devices (100). They may be used for display, monitoring, control or locking of optical signal sources. They may be used to determine relative and absolute wavelength variations in an optical beam (130).</p>
申请公布号 WO2000023764(A1) 申请公布日期 2000.04.27
申请号 US1999024185 申请日期 1999.10.15
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