| 摘要 |
According to the invention, an incident light beam (2) is guided in a direction (D) onto a surface area (4) which is to be analyzed, and the light reflected by said surface area (4) in the same direction (D) or in at least an adjacent direction (D') is simultaneously measured without physical contact between the measuring device (1) and the surface area (4) which is to be analyzed. These procedures are then repeated, whereby the inclination of the direction (D) is altered with regard to said surface area. Finally, the data obtained therefrom is processed in order to quantify the reflective properties of the examined surface area (4). |
