| 摘要 |
The method involves coupling one pole of a voltage source to the upper and lower conductive layers (2,4). The opposite pole is coupled to a measuring point (7), which penetrates the upper conductive layer and the intermediate layer (3). The displacement of the measuring point is detected as it is moved perpendicularly between the upper and the lower conductive layers. The circuit is closed when the measuring point is connected to either of the connecting layers, so the beginning and end of the measurement can be detected. The beginning of the measurement can be taken as the beginning of the upper layer, and the end of the measurement can be taken as the beginning of the lower layer. The upper layer thickness is then subtracted to obtain the intermediate layer thickness. An Independent claim for a thickness measuring device is also included. |
