发明名称 SEMICONDUCTOR DEVICE HAVING LOW CONTACT RESISTANCE TO HIGHLY DOPED REGION
摘要 PURPOSE: A semiconductor device having low resistance to highly doped region is provided to decrease thickness of a titanium layer and to simply reduce contact resistance to diffused region without an obstacle of a thin oxide layer. CONSTITUTION: At least a layer containing titanium is provided to a contact hole between highly doped region or a region(2) made into silicon and contact metal(8) connected to external lead. A semiconductor device has low contact resistance to highly doped region or a region(2) made into silicon of n plus or p plus conductive type of a semiconductor body. A halogen is provided to the highly doped region or the region(2) made into silicon of the contact hole(4). The halogen is a fluorine and injected in amount of 10sup12 to 10sup16.
申请公布号 KR20000023765(A) 申请公布日期 2000.04.25
申请号 KR19997000231 申请日期 1999.01.14
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 PENKA POLKER;MANKOV RAINHART;BURCHER HELMUT
分类号 H01L21/28;H01L21/265;H01L21/285;H01L21/768;(IPC1-7):H01L21/28 主分类号 H01L21/28
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