发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A semiconductor memory device is provided to prevent degradation due to fatigue phenomenon by using reference cells having operating times more than the capacitor of a memory cells in non-reversed area, thereby increasing the life of LSI ferroelectric memory cell(FeRAM) CONSTITUTION: A semiconductor memory device comprises plural ferroelectric memory cells (40) and plural reference cells(30). The capacitor area of the memory cell is same to the capacitor area of the reference cell. The voltage(Vm) applied to the memory cell is smaller than the voltage(Vr) applied to the reference cell. The voltage(Vr) is between voltage of high status and voltage of low status in the memory cell.
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申请公布号 |
KR20000023855(A) |
申请公布日期 |
2000.04.25 |
申请号 |
KR20000003094 |
申请日期 |
2000.01.22 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
YANG, DU YOUNG |
分类号 |
H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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